Summary
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Authors: Gianluca Borghini; Pietro Aricò; Gianluca Di Flumeri; Nicolina Sciaraffa; Antonello Di Florio; Vincenzo Ronca; Andrea Giorgi; Lorenzo Mezzadri; Renzo Gasparini; Roberto Tartaglino; Arianna Trettel; Fabio Babiloni
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/embc48229.2022.9871893