Summary
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Authors: Vincenzo Ronca; Gianluca Di Flumeri; Alessia Vozzi; Andrea Giorgi; Pietro Aricò; Nicolina Sciaraffa; Fabio Babiloni; Gianluca Borghini
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/embc48229.2022.9871505