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Authors: Alfio Di Mauro; Arpan Suravi Prasad; Zhikai Huang; Matteo Spallanzani; Francesco Conti; Luca Benini
Journal title: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2022
Published pages: 825 - 830
DOI identifier: 10.23919/date54114.2022.9774552
ISBN: 978-3-9819263-6-1