Summary
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Authors: S.Hosseini, Ramón J. Durán Barroso, Ignacio de Miguel, O.Gonzalez de Dios, N. Merayo, J.C. Aguado, E. Echeverry, P. Fernández, R. M. Lorenzo, E. J. Abril
Journal title: IEEE
Journal publisher: IEEE
Published year: 2023
Published pages: pp. 204-206
DOI identifier: 10.1109/itnac55475.2022.9998374
ISBN: 978-1-6654-7103-9