Summary
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Authors: Alvaro Jover-Alvarez, Alejandro J. Calderon, Ivan Rodriguez, Leonidas Kosmidis, Kazi Asifuzzaman, Patrick Uven, Kim Gruttner, Tomaso Poggi, Irune Agirre
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.23919/date51398.2021.9474040