Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes

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Authors: A. HERZOG, S. BENKNER, B. ZANDI, M. BUFFOLO, WILLEM D. VAN DRIEL, M. MENEGHINI AND T.Q. KHANH

Journal title: IEEE Access

Journal number: 27 February 2023, Volume 11

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2023

Published pages: 19928-19940

DOI identifier: 10.1109/access.2023.3249478

ISSN: 2169-3536