Summary
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Authors: A. Caria, R. Fraccaroli, G. Pierobon, G. Murab,C. De Santi, M. Buffolo, N. Trivellin, E. Zanoni, G. Meneghesso, M. Meneghini
Journal title: The 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis/Microelectronics Reliability
Journal number: October 2nd to 5th, 2023
Journal publisher: Elsevier BV
Published year: 2023
ISSN: 0026-2714