Automated peak detection for analysis of error propagations and validation of structure functions in reliability tests of LED systems

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Authors: S. Fischer, J. Magnien,H. Röthl, E. Kraker

Journal title: 29th INTERNATIONAL WORKSHOP Thermal Investigations of ICs and Systems-Therminic 2023

Journal number: 27-29 September 2023

Journal publisher: IEEE

Published year: 2023