Design of power cycling for reliability testing of LED systems: Numerical and analytical approach

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Authors: J. Magnien, L. Mitterhuber, E. KrakerJ. Magnien, L. Mitterhuber, E. Kraker

Journal title: 29th INTERNATIONAL WORKSHOP Thermal Investigations of ICs and Systems

Journal number: 27-29 September 2023

Journal publisher: IEEE

Published year: 2023