Long-term temperature-dependent degradation of 175 W chip-on-board LED modules

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Authors: ALEXANDER HERZOG, MAX WAGNER, SIMON BENKNER, WILLEM D. VAN DRIEL, AND TRAN QUOC KHANH

Journal title: IEEE Transactions on Electron Devices

Journal number: Volume: 69, Issue: 12, December 2022

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2022

Published pages: 6830-6836

DOI identifier: 10.1109/ted.2022.3214169

ISSN: 0018-9383