Flexible and dependable manufacturing beyond xURLLC: A novel framework for communication-control co-design

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Authors: Han, Bin; Sun, Mu-Xia; Muk, Lai-Kan; Schotten, Hans D.

Journal title: 2022 IEEE 22nd International Conference on Software Quality, Reliability, and Security Companion (QRS-C)

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/QRS-C57518.2022.00090