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Authors: R. Fontanini; J. Barbot; M. Segatto; S. Lancaster; Q. Duong; F. Driussi; L. Grenouillet; F. Triozon; J. Coignus; T. Mikolajick; S. Slesazeck; D. Esseni
Journal title: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC)
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/essderc53440.2021.9631812
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