Linking the Intrinsic Electrical Response of Ferroelectric Devices to Material Properties by means of Impedance Spectroscopy

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Lorenzo Benatti, Sara Vecchi, Francesco Maria Puglisi

Journal title: IEEE Transactions on Device and Materials Reliability

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2023

DOI identifier: 10.1109/tdmr.2023.3261441

ISSN: 1558-2574