Impedance Investigation of MIFM Ferroelectric Tunnel Junction Using a Comprehensive Small-Signal Model

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Authors: LORENZO BENATTI; Francesco Maria PUGLISI

Journal title: IEEE Transactions on Device and Materials Reliability

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2022

DOI identifier: 10.1109/tdmr.2022.3182941

ISSN: 1530-4388