Combining Experiments and a Novel Small Signal Model to Investigate the Degradation Mechanisms in Ferroelectric Tunnel Junctions

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Authors: Lorenzo Benatti, Paolo Pavan, Francesco Maria Puglisi

Journal title: IEEE International Reliability Physics Symposium (IRPS) 2022

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/irps48227.2022.9764602