Investigating charge trapping in ferroelectric thin films through transient measurements

Summary

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Authors: Suzanne Lancaster; Patrick D. Lomenzo; Moritz Engl; Bohan Xu; Thomas Mikolajick; Uwe Schroeder; Stefan Slesazeck

Journal title: Frontiers in Nanotechnology

Journal publisher: Frontiers Media

Published year: 2023

DOI identifier: 10.3389/fnano.2022.939822

ISSN: 2673-3013