Versatile experimental setup for FTJ characterization

Summary

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Authors: M. Massarotto; F. Driussi; A. Affanni; S. Lancaster; S. Slesazeck; T. Mikolajick; D. Esseni

Journal title: Solid-State Electronics

Journal publisher: Pergamon Press Ltd.

Published year: 2022

DOI identifier: 10.1016/j.sse.2022.108364

ISSN: 0038-1101