Summary
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Authors: Daniel Lizzit; David ESSENI; Mattia Segatto; Francesco Driussi; Riccardo Fontanini
Journal title: IEEE Journal of the Electron Devices Society
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2022
DOI identifier: 10.1109/jeds.2022.3164652
ISSN: 2168-6734