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Authors: M. Massarotto, M. Segatto, F. Driussi; A. Affanni, S. Lancaster, S. Slesazeck, T. Mikolajick, D. Esseni
Journal title: International Conference on Microelectronic Test Structure (ICMTS) 2023
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/icmts55420.2023.10094178
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