Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications

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Authors: L. Grenouillet, J. Barbot, J. Laguerre, S. Martin, C. Carabasse, M. Louro, M. Bedjaoui, S. Minoret, S. Kerdilès, C. Boixaderas, T. Magis, C. Jahan, F. Andrieu, J. Coignus

Journal title: IEEE International Reliability Physics Symposium (IRPS) 2023

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/irps48203.2023.10118099