Summary
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Authors: Hyowon Kim, Hui Chen, Musa Furkan Keskin, Yu Ge, Kamran Keykhosravi, George C. Alexandropoulos, Sunwoo Kim, Henk Wymeersch
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/TWC.2021.3136449
ISSN: 1536-1276