Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices: a DFT based Study

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Authors: Antoine Jay; Anne Hémeryck; Filadelfo Cristiano; Denis Rideau; P.L. Julliard; Vincent Goiffon; A. LeRoch; Nicolas Richard; L. Martin Samos; S. de Gironcoli

Journal title: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

Journal publisher: IEEE

Published year: 2021

Published pages: 128-132

DOI identifier: 10.1109/sispad54002.2021.9592553

ISBN: 9781665406864