Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part II: Experimental

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Authors: J. Michl, A. Grill, D. Waldhoer, W. Goes, B. Kaczer, D. Linten, B. Parvais, B. Govoreanu, I. Radu, T. Grasser, M. Waltl

Journal title: IEEE Trans. Electron Devices

Journal number: 68(12)

Journal publisher: IEEE

Published year: 2021

Published pages: 6372-6378

DOI identifier: 10.1109/ted.2021.3117740

ISSN: 1557-9646