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Authors: C. Wilhelmer, D. Waldhoer, M. Jech, A.M. El-Sayed, L. Cvitkovich, M. Waltl, T. Grasser
Journal title: Microelectron. Reliab.
Journal number: 139
Journal publisher: Elsevier BV
Published year: 2022
Published pages: 114801
DOI identifier: 10.1016/j.microrel.2022.114801
ISSN: 0026-2714