Ab initio investigations in amorphous silicon dioxide: Proposing a multi-state defect model for electron and hole capture

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Authors: C. Wilhelmer, D. Waldhoer, M. Jech, A.M. El-Sayed, L. Cvitkovich, M. Waltl, T. Grasser

Journal title: Microelectron. Reliab.

Journal number: 139

Journal publisher: Elsevier BV

Published year: 2022

Published pages: 114801

DOI identifier: 10.1016/j.microrel.2022.114801

ISSN: 0026-2714