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Authors: G. Larrieu, J. Müller, S. Pelloquin, A. Kumar, K. Moustakas, P. Michałowski, A. Lecestre
Journal title: 21st International Workshop on Junction Technology (IWJT)
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.23919/iwjt59028.2023.10175172