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Authors: R. Ramilli, F. Santoni, A. De Angelis, M. Crescentini, P. Carbone, P. A. Traverso
Journal title: IEEE Transactions on Instrumentation and Measurement ( Volume: 71)
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/tim.2022.3196439
ISSN: 1557-9662