Towards a Testbed for Critical Industrial Systems: SunSpec Protocol on DER Systems as a Case Study

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Authors: Esteban Damián Gutiérrez Mlot; Jose Saldana; Ricardo J. Rodríguez

Journal title: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)

Journal number: Annual

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/etfa52439.2022.9921522

ISBN: 978-1-6654-9997-2