Low-Cost First-Order Secure Boolean Masking in Glitchy Hardware

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Authors: S V Dilip Kumar; Josep Balasch; Benedikt Gierlichs; Ingrid Verbauwhede

Journal title: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal publisher: IEEE Explore

Published year: 2023

DOI identifier: 10.23919/date56975.2023.10136920

ISSN: 1558-1101