Verification of in-situ observation of perovskite layer curing and quenching and surface imaging on > 20 x 20 cm² on moving substrate (0.5 m/min)

The Insitu XRD at TNO is operational and has been used to characterise Perovskite layer samples with previously unknown properties The characterisation results for selected samples will be made available to the public CaseStudy WhitePaperopen access scientific publication to advertise the NanoQI solution Task 61