FLIE: First-Look Enabled Inspect-Explore Autonomy Toward Visual Inspection of Unknown Distributed and Discontinuous Structures

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Authors: Vignesh Kottayam Viswanathan; Sumeet Gajanan Satpute; George Nikolakopoulos

Journal title: Crossref

Journal number: 1

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2023

DOI identifier: 10.1109/access.2023.3257646

ISSN: 2169-3536