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Authors: C. Laguna , M. Bernard, F. Fillot, D. Rouchon, N. Rochat, J. Garrione, L. Prazakova, E. Nolot, V. Meli, N. Castellani, S. Martin, C. Sabbione, G. Bourgeois , M.C. Cyrille, L. Militaru, A. Souifi, F. Andrieu, G. Navarro
Journal title: IEEE Transactions on Electron Devices
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/ted.2022.3203368
ISSN: 1557-9646