Fast Fitting of the Dynamic Memdiode Model to the Conduction Characteristics of RRAM Devices Using Convolutional Neural Networks

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Authors: Fernando Leonel Aguirre, Eszter Piros, Nico Kaiser, Tobias Vogel, Stephan Petzold, Jonas Gehrunger, Timo Oster, Christian Hochberger, Jordi Suñé, Lambert Alff and Enrique Miranda

Journal title: Micromechanics

Journal publisher: Multidisciplinary Digital Publishing Institute (MDPI)

Published year: 2022

DOI identifier: 10.3390/mi13112002

ISSN: 2072-666X