Measurement-based Characterization of Physical Layer Security for RIS-assisted Wireless Systems

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Authors: S. Keşir, S. Kayraklık, I. Hökelek, A. E. Pusane, E. Başar, A. Görçin

Journal title: IEEE VTC 2023 Spring

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.48550/arxiv.2212.07254