Enhanced Thermal Confinement in Phase-Change Memory Targeting Current Reduction

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Authors: C. De Camaret, G. Bourgeois, O. Cueto, V. Meli, S. Martin, D. Despois, V. Beugin, N. Castellani, M.C. Cyrille, F. Andrieu, J. Arcamone, Y. Le-Friec and G. Navarro

Journal title: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/essderc55479.2022.9947190