A generalizable, uncertainty-aware neural network potential for GeSbTe with Monte Carlo dropout

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Sung-Ho Lee, Valerio Olevano, Benoit Sklénard

Journal title: Solid-State Electronics Volume 199, January 2023, 108508

Journal publisher: Pergamon Press Ltd.

Published year: 2023

DOI identifier: 10.1016/j.sse.2022.108508

ISSN: 0038-1101