Summary
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Authors: Day Shi, Xun Zhang, Ziqi Liu, Xuanbang Chen, Xiadong Liu, Jintao Wang, Jian Song, Andrei Vladimirescu
Journal title: IEEE Transactions on Electron Devices
Journal number: 71
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2023
Published pages: 337-342
DOI identifier: 10.1109/ted.2023.3312632
ISSN: 0018-9383