Low frequency noise study of X-ray irradiated Si/SiGe:C BiCMOS technology bipolar transistors

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Authors: A Adebabay Belie, J El Beyrouthy, Fabien Pascal, J Boch, T Maraine, M Bouhouche, Bruno Sagnes, S Haendler, P Chevalier, D Gloria

Journal publisher: 26th International Conference on Noise and Fluctuations

Published year: 2023