Comparison of assessment methods for in-situ 5G NR base station exposure

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Authors: Deprez, Kenneth; Verloock, Leen; Colussi, Loek; Aerts, Sam; Van den Bossche, Matthias 2; Kamer, Jos; Bolte, John; Martens, Luc; Plets, David; Joseph, Wout

Journal publisher: BioEM

Published year: 2022