Special Session: Neuromorphic hardware design and reliability from traditional CMOS to emerging technologies

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Authors: Pavanello, Fabio; Vatajelu, Ioana; Bosio, Alberto; van Vaerenbergh, Thomas; Bienstman, Peter; Charbonnier, Benoit; Carpegna, Alessio; Di Carlo, Stefano; Savino, Alessandro

Journal title: Proceedings of 2023 IEEE 41st VLSI Test Symposium (VTS)

Journal publisher: IEEE 2023

Published year: 2023

DOI identifier: 10.48550/arxiv.2305.01818

ISSN: 0000-0000