Summary
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Authors: Nikolaos Nikolaidis, Apostolos Ampatzoglou, Alexander Chatzigeorgiou, Nikolaos Mittas, Evdokimos Konstantinidis, Panagiotis Bamidis
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/TechDebt59074.2023.00018
ISBN: 979-8-3503-1194-5
