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Authors: N. Pavón Hernandez; L. Moliner; Alejandro Lucero; S. Jiménez-Serrano; A. González-Montoro; David Sanchez; C. Valladares; J. Barberá; K. Vidal; Antonio Javier Gonzalez Martinez; J. M. Benlloch
Journal title: Conference: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/NSSMICRTSD49126.2023.10338203
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