AFM‐Based Hamaker Constant Determination with Blind Tip Reconstruction

Summary

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Authors: Ku, B., van de Wetering, F., Bolten, J., Stel, B., van de Kerkhof, M. A. & Lemme, M. C.

Journal title: Advanced Materials Technologies

Journal publisher: Wiley

Published year: 2022

DOI identifier: 10.1002/admt.202200411

ISSN: 2365-709X