An Empirical Roofline Model for Extreme-Scale I/O Workload Analysis

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Authors: Zhu, Zaobin; Bartelheimer, Niklas; Neuwirth, Sarah M.

Journal title: 2023 IEEE International Parallel and Distributed Processing Symposium Workshops (IPDPSW)

Journal number: 3

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/IPDPSW59300.2023.00106