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Authors: A. Ferikoglou, A. Kokkinis, D. Danopoulos, I. Oroutzoglou, A. Nanos, S. Karanastasis, M. Sipos, J. Ghotbi, J.J. Vegas-Olmos, D. Masouros, K. Siozios
Journal title: Design, Automation & Test in Europe Conference & Exhibition (DATE 2023)
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.23919/date56975.2023.10137039
ISBN: 979-8-3503-9624-9