Shortcomings of Top-Down Randomization-Based Sanity Checks for Evaluations of Deep Neural Network Explanations

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Authors: Binder, Alexander; Weber, Leander; Lapuschkin, Sebastian; Montavon, Gregoire; Müller, Klaus-Robert; Samek, Wojciech

Journal title: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)

Journal number: 2023

Journal publisher: IEEE

Published year: 2023

Published pages: 16143-16152

DOI identifier: 10.1109/cvpr52729.2023.01549