Estimating the Failures and Silent Errors Rates of CPUs Across ISAs and Microarchitectures

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Authors: Gizopoulos, Dimitris; Papadimitriou, George; Chatzopoulos, Odysseas

Journal title: 2023 IEEE International Test Conference (ITC)

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/ITC51656.2023.00056