AI-driven TEM alignment and configuration for better data acquisition

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Authors: L. Grossetête, C. Marcelot, C. Gatel, S. Pauchet, M.J. Hÿtch

Journal title: Proc. Colloque de la Société Française des Microscopies (SFmu 2023, Rouen)

Journal publisher: n.a.

Published year: 2023