Safe Wiring Interconnection Systems (SEWIS)

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Authors: Robert Lowndes1*, Ian Cotton1, Thomas Hähner2, Patrick Rybski2, Stéphane Balerin3, and Mukul Sosale Keerthi4 1The University of Manchester, Department of Electrical and Electronic Engineering, School of Engineering, Manchester,M1 7HL, United Kingdom 2Nexans 140/146 avenue Eugène Delacroix91210 Draveil, France 3Souriau Interconnect Technologies, Aerospace Group, Eaton, 89 route de St Hubert, 724

Journal title: International Symposium on High Voltage Engineering

Journal number: Annual

Journal publisher: IET

Published year: 2023

Published pages: 1502-1507