Summary
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Authors: Doulkeridis, Christos; Santipantakis, Georgios ; Koutroumanis, Nikolaos ; Makridis, George ; Koukos, Vasilis ; Theodoropoulos, George S. ; Theodoridis, Yannis ; Kyriazis, Dimosthenis ; Kranas, Pavlos ; Burgos, Diego ; Jimenez-Peris, Ricardo ; Duarte, Mari
Journal title: IEEE EXPLORE
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/BigData59044.2023.10386539