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Authors: L. Capua, Y. Sprunger, H. Elettro, F.Risch, A. Grammoustianou, R. Midahuen, T. Ernst, S. Barraud R. Gill and A.M. Ionescu
Journal title: IEEE Transactions on Electron Devices
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
DOI identifier: 10.1109/ted.2022.3144108
ISSN: 0018-9383